Material Science Related Instrumentation

Differential Scanning Calorimetry (DSC): The basis for the DSC technique is that when a sample undergoes a physical transformation, such as a phase transition, more or less heat will be needed depending on whether the transformation is endothermic or exothermic. A DSC is able to accurately measure the heat absorbed or released during a transition. Some areas where DSC is used is in studying polymer and pharmaceutical formulations, liquid crystals, oxidation stability, and metallurgy.

TA instruments model Q20 DSC

TA instruments model Q20 DSC

AFM/STM:

Nanosurf EasyScan 2 with AFM and STM options.

AFM: Atomic Force Microscope, images a surface by measuring the repulsion/attraction of a cantilever tip as the tip scans across the sample surface, generally better resolution than STM, good for conductors and insulators.

STM: Scanning Tunneling Microscope, images a surface by measuring the tunneling current between tip and surface, good only for conductors.

afm-stm