Equipment list: Electron Microscopy and Microanalysis Facility

  • JEOL-JEM 2100F Analytical Transmission Electron Microscope (TEM)
  • Hitachi S-4700 II Scanning Electron Microscope (SEM)
  • Fischione Instruments model 150 dimpling grinder
  • Fischione Instruments model 170 ultrasonic disk cutter
  • Buehler Isomet low speed saw
  • Fischione Instruments model 1010 low angle ion mill
  • Quorum Technologies K575X turbo sputter coater
  • Fischione Instruments model 110 automatic twin-jet electropolisher
  • SPI plasma prep cleaner
  • "Smart-1" STM-20 electromechanical testing system
  • Applied Test Systems, Inc. 2410 lever arm creep testing system
  • South Bay Technology Model 850 wire saw
  • Electron Microscopy Sciences 150T turbo-pumped combo sputter and carbon coater
  • Leica ultramicrotome EM UC7 with control unit
  • Olympus PMG3 inverted metallurgic microscope with attached digital camera

Technical info & pricing: EMMF website | Krista Carlson, Director (775) 682-6245 | Karthik Baskaran, Manager

For entities external to NSHE, contact the Nevada Center for Applied Research for access: | (775) 784-4781